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国際会議論文(査読有り) 2012年

7 Takuya Sawada, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata, "Measurements of SRAM Sensitivity against AC Power Noise with Effects of Device Variation," Proc. 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS 2013), #4.2, pp. 77-80, Mar. 2013, Osaka.
6 Satoshi Takaya, Makoto Nagata, Atsushi Sakai, Takashi Kariya, Shiro Uchiyama, Harufumi Kobayashi, Hiroaki Ikeda, "A 100GB/s Wide I/O with 4096b TSVs Through an Active Silicon Interposer with In-Place Waveform Capturing," Dig. Tech. Papers, 2013 IEEE Intl. Solid-State Circuits Conference (ISSCC), #24.8, pp. 434-435, Feb. 2013, San Francisco.
5 Kumpei Yoshikawa, Makoto Nagata, "Co-simulation of AC Power Noise of CMOS Microprocessor using Capacitor Charging Modeling," Proc. IEEE CPMT Symposium Japan 2012 #19-2, pp. 293-296, Dec. 2012. Kyoto.
4 Takeshi Okumoto, Kumpei Yoshikawa, Makoto Nagata, "Monitoring Effective Supply Voltage within Power Rails of Integrated Circuits," Proc. 2012 IEEE Asian Solid-State Circuits Conference (A-SSCC 2012), #4-4, pp. 113-116, Nov. 2012. Kobe.
3 Takuya Sawada, Hidehiro Takata, Koji Nii, Makoto Nagata, "Sensitivity of SRAM Operation against AC Power Supply Voltage Variation," Extended Abstracts of the 2012 International Conference on Solid State Devices and Materials (SSDM 2012), #J-3-1, pp. 1128-1129, Sep. 2012. Kyoto.
2 Sho Endo, Yuichi Hayashi, Naofumi Homma, Takafumi Aoki, Toshihiro Katashita, Yohei Hori, Kazuo Sakiyama, Makoto Nagata, Jean-Luc Danger, Thanh-Ha Le and Pirouz Bazargan Sabet, "Measurement of Side-Channel Information from Cryptographic Devices on Security Evaluation Platform: Demonstration of SPACES Project," SICE Annual Conference 2012, #TuA11-05, pp.313-316, Aug. 2012. Akita.
1 Yuta Sasaki, Kumpei Yoshikawa, Kouji Ichikawa, Makoto Nagata, "Co-Evaluation of Power Supply Noise of CMOS Microprocessor using On-Boar Magnetic Probing and On-Chip Waveform Capturing Techniques," IEEE 2012 International Meeting for Future of Electron Devices, Kansai (IMFEDK 2012), #S-1, pp. 70-71, May 2012, Osaka.